UMLS. CSP-HL7-ICD9CM-NCI-NDFRT-RXNORM
%
A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
E E0 E6 E7 EA EB EC ED EE EF EG EH EI EJ EK EL EM EN EO EP EQ ER ES ET EU EV EW EX EY
EL EL6 ELA ELB ELD ELE ELI ELK ELL ELM ELO ELS ELY

electron probe microanalysis

[identification and measurement of concentration of elements based on the fact that primary-emission x-rays emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration; may be performed by an electron probe microanalyzer, an electron microscope microanalyzer, or by an electron microscope, or scanning electron microscope, fitted with an x-ray spectrometer. ( CSP )]
UMLS (CSP) C0013844
 
Laboratory Procedure
Relation/PAR: spectrometry

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